Iingenelo
Ukumelana ne-oxidation yobushushu obuphezulu
Uxhathiso olugqwesileyo lweCorrosion
Ukuxhathisa okulungileyo kweAbrasion
I-coefficient ephezulu yokushisa ukushisa
Ukuzithambisa, ukuxinana okuphantsi
Ukuqina okuphezulu
Uyilo olulungiselelweyo.
Usetyenziso
-Indawo ekwaziyo ukumelana nokunxiba: ibhulorho, ipleyiti, umbhobho wesanti, umgca wenkanyamba, umphanda wokusila, njl.
-Umgangatho wobushushu obuphezulu: i-siC Slab, iTube yokuCima iFurnace, iTube eRadiant, i-crucible, i-Heating Element, i-Roller, i-Beam, i-Heat Exchanger, i-Cold Air Pipe, i-Burner Nozzle, i-Thermocouple Protection Tube, isikhephe se-SiC, i-Kiln car Structure, i-Setter, njl.
-I-Silicon Carbide Semiconductor: Isikhephe se-SiC wafer, i-sic chuck, i-sic paddle, i-sic cassette, i-sic diffusion ityhubhu, i-wafer fork, ipleyiti yokufunxa, isikhokelo, njl.
-I-Silicon Carbide Seal Field: zonke iintlobo zeringi yokutywina, ukuthwala, i-bushing, njl.
-I-Photovoltaic Field: I-Cantilever Paddle, i-Barrel yokugaya, i-Silicon Carbide Roller, njl.
-Indawo yebhetri yeLithium
IiPropati zoBume beSiC
Ipropati | Ixabiso | Indlela |
Ukuxinana | 3.21 g/cc | I-Sink-float kunye ne-dimension |
Ubushushu obuthile | 0.66 J/g °K | Isibane se-laser pulsed |
Amandla e-Flexural | 450 MPa560 MPa | I-4 point bend, i-RT4 point bend, i-1300 ° |
Ukuqina kokwaphuka | 2.94 MPa m1/2 | I-Microindentation |
Ukuqina | 2800 | Vicker, 500g umthwalo |
Elastic ModulusOlutsha's Modulus | 450 GPA430 GPA | 4 pt ukugoba, RT4 pt ukugoba, 1300 °C |
Ubungakanani beenkozo | 2 – 10 µm | I-SEM |
Iipropati zoThermal zeSiC
I-Thermal Conductivity | 250 W/m °K | Indlela yeLaser flash, RT |
Ukwandiswa kweThermal (CTE) | 4.5 x 10-6 °K | Ubushushu begumbi ukuya kuma-950 °C, i-silica dilatometer |
IiParameters zobuGcisa
Into | Iyunithi | Idatha | ||||
I-RBSiC(SiSiC) | NBSiC | I-SSiC | RSiC | OSiC | ||
Umxholo weSiC | % | 85 | 75 | 99 | 99.9 | ≥99 |
Umxholo wesilicon wasimahla | % | 15 | 0 | 0 | 0 | 0 |
Ubushushu benkonzo enkulu | ℃ | 1380 | 1450 | 1650 | 1620 | 1400 |
Ukuxinana | g/cm3 | 3.02 | 2.75-2.85 | 3.08-3.16 | 2.65-2,75 | 2.75-2.85 |
I-porosity evulekile | % | 0 | 13-15 | 0 | 15-18 | 7-8 |
Amandla okugoba 20℃ | Mpa | 250 | 160 | 380 | 100 | / |
Amandla okugoba 1200℃ | Mpa | 280 | 180 | 400 | 120 | / |
Imodyuli ye-elasticity 20℃ | Gpa | 330 | 580 | 420 | 240 | / |
Imodyuli ye-elasticity 1200℃ | Gpa | 300 | / | / | 200 | / |
Thermal conductivity 1200℃ | W/mK | 45 | 19.6 | 100-120 | 36.6 | / |
I-Coefficient yokwandiswa kwe-thermal | K-1X10-6 | 4.5 | 4.7 | 4.1 | 4.69 | / |
HV | Kg/mm2 | 2115 | / | 2800 | / | / |
I-CVD ye-silicon carbide yokwambathisa kumphezulu wangaphandle we-silicon carbide iimveliso ze-ceramic ezinokufikelela kubunyulu obungaphezulu kwe-99.9999% ukuhlangabezana neemfuno zabathengi kwishishini le-semiconductor.